Extended Wavelength Detector Design

The QuantX-300 features a patent-pending summed Si/Ge detector design to provide a seamless, wide wavelength range. With traditional systems, two different detectors are needed to cover the wavelength ranges of Silicon and Germanium, requiring operators to stop scans and change detectors while scanning over the whole wavelength range. With the QuantX-300, continuous scans from 325 to 1800 nm can be accomplished without swapping detectors, saving time and removing the possibility of having the wrong detector in place. Our IQE-200B utilizes only a Silicon detctor, however Newport can upgrade this system to include a summed Si/Ge detector design – contact us for more information.

優(yōu)良的技術

全新 IQE 200B 運用了 Newport 在光學設計、光譜、精確運動控制和電子技術領域的專業(yè)優(yōu)勢。這些優(yōu)勢可集中在一個完整、優(yōu)良的量子效率（EQE 和 IQE）測量系統(tǒng)。IQE 200B 使用已申請專有權利的分束器結構，可以同時測量 EQE 以及量化 反射損耗的IQE。帶有熱敏電阻的集成真空卡盤是該型號的一大特點。該型號還包含 4 線傳感，能夠拓寬采樣大小和采樣效率的最大范圍。

Additional Accessories

Newport offers a variety of accessories, sold separately, to provide a complete measurement station including:

• Temperature controlled vacuum chuck

• Light biasing

• Electrical probing

• Water chiller

• Vacuum pump (110 or 220 VAC)

• Light Tight Enclosure for QuantX-300

• Optical tables, workstations and breadboards (IG-23-2 industrial grade honeycomb core breadboard is recommended)

直觀的軟件

IQE 200B 的采集和控制軟件已經(jīng)預安裝在測量系統(tǒng)附帶的筆記本電腦上。該軟件采用直觀的、基于圖標的圖形界面來進行儀器控制、配置和數(shù)據(jù)采集。軟件可無縫控制所有系統(tǒng)組件。在單次掃描中即可計算并繪制波長的 EQE 和 IQE 曲線，而無需重新定位探測器或樣品，從而優(yōu)化測量精度和重復定位精度。